Silicon Optical Windows 硅窗口片
High‑transmittance silicon windows for IR optics and semiconductor‑related applications. Custom size, thickness, chamfer, and optical surface requirements supported. 面向红外光学与半导体相关应用的高透过率硅窗口片，支持尺寸、厚度、倒角与光学表面质量等定制需求。
Overview产品概述
Silicon optical windows are widely used for IR transmission. We deliver windows with controllable dimensions, edge quality and optical surface requirements, supporting prototype to small‑batch orders. 硅窗口片广泛用于红外透过系统。我们提供可控的尺寸、公差、边缘质量与光学表面要求，支持样品到小批量交付。
Deliverables交付内容
- Finished silicon window成品硅窗口片
- Protective packaging防护包装
- QC report / records (as required)检验报告/记录（按需）
Supported formats支持形式
- Round / square / special shapes圆形 / 方形 / 异形
- Single‑side / double‑side polish单面 / 双面抛光
- Chamfer / edge treatment倒角 / 边缘处理
Key Specs (Placeholder)关键指标（占位）
Replace these placeholders with your real datasheet values. 可将以下占位内容替换为真实规格书参数。
Mechanical机械指标
- Size / thickness: custom尺寸/厚度：可定制
- Tolerance: per drawing公差：按图纸
- Edge: chamfer / bevel边缘：倒角/斜边
Optical光学指标
- Surface quality: per requirement表面质量：按需求
- Roughness: per requirement粗糙度：按需求
- Coating: optional镀膜：可选
Customization Checklist定制清单
- Shape & size (e.g., Ø25 mm)形状与尺寸（如 Ø25 mm）
- Thickness & quantity厚度与数量
- Surface requirement (polish / roughness)表面要求（抛光/粗糙度）
- Edge: chamfer / bevel边缘：倒角/斜边
- Coating (if needed)镀膜需求（如有）
- Application & environment应用场景与使用环境
Quality & Documents质量与文档
Inspection检验
- Incoming / in‑process / final QC来料 / 过程 / 成品检验
- Records for traceability记录可追溯
Documents文档
- QC report / COA (as required)检验报告 / COA（按需）
- Packaging & shipment notes包装与发货说明
Applications应用场景
- IR Imaging红外成像 — Thermal cameras, IR modules, system windows.热成像、红外模组、系统窗口件。
- Inspection & Metrology检测与计量 — Optical inspection, alignment, measurement fixtures.光学检测、对准与测量工装。
- Semiconductor Equipment半导体设备 — Windows and components for semiconductor‑related systems.半导体相关系统的窗口与光学部件。